Silicon carbide high frequency devices

被引:44
作者
Weitzel, CE [1 ]
机构
[1] Motorola Inc, Phoenix Corp, Res Labs, Tempe, AZ 85284 USA
来源
SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2 | 1998年 / 264-2卷
关键词
silicon; gallium arsenide; silicon carbide; gallium nitride; high-frequency; high-power FET; MESFET; HFET; SIT;
D O I
10.4028/www.scientific.net/MSF.264-268.907
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
4H-SiC MESFET's (MEtal Semiconductor Field-Effect Transistor) have achieved the highest f(max) (greater than or equal to 42 GHz) and the highest power densities, 3.3 W/mm at 850 MHz (CW) and at 10 GHz (pulsed). On the other hand, 4H-SiC SIT's (Static Induction Transistor) have achieved the highest output power, 450 W (pulsed) at 600 MHz and 38 W (pulsed) at 3 GHz. Moreover a one kilowatt, 600 MHz SiC power module containing four SIT's with a total source periphery of 94.5 cm has been demonstrated.
引用
收藏
页码:907 / 912
页数:6
相关论文
共 22 条
[11]  
OHKAWA S, 1975, FUJITSU SCI TECHNICA, P151
[12]  
SCHAFFER WJ, 1994, DIAMOND SIC NITRIDE, V339, P595
[13]  
Siergiej RR, 1996, INST PHYS CONF SER, V142, P769
[14]  
Siergiej RR, 1997, 55TH ANNUAL DEVICE RESEARCH CONFERENCE, DIGEST - 1997, P136, DOI 10.1109/DRC.1997.612502
[15]   4H-SiC MESFET's with 42 GHz f(max) [J].
Sriram, S ;
Augustine, G ;
Burk, AA ;
Glass, RC ;
Hobgood, HM ;
Orphanos, PA ;
Rowland, LB ;
Smith, TJ ;
Brandt, CD ;
Driver, MC ;
Hopkins, RH .
IEEE ELECTRON DEVICE LETTERS, 1996, 17 (07) :369-371
[16]  
Sriram S, 1997, 55TH ANNUAL DEVICE RESEARCH CONFERENCE, DIGEST - 1997, P138, DOI 10.1109/DRC.1997.612503
[17]   THE POTENTIAL OF DIAMOND AND SIC ELECTRONIC DEVICES FOR MICROWAVE AND MILLIMETER-WAVE POWER APPLICATIONS [J].
TREW, RJ ;
YAN, JB ;
MOCK, PM .
PROCEEDINGS OF THE IEEE, 1991, 79 (05) :598-620
[18]   4H-SIC MESFET WITH 2.8-W/MM POWER-DENSITY AT 1.8-GHZ [J].
WEITZEL, CE ;
PALMOUR, JW ;
CARTER, CH ;
NORDQUIST, KJ .
IEEE ELECTRON DEVICE LETTERS, 1994, 15 (10) :406-408
[19]   Silicon carbide high-power devices [J].
Weitzel, CE ;
Palmour, JW ;
Carter, CH ;
Moore, K ;
Nordquist, KJ ;
Allen, S ;
Thero, C ;
Bhatnagar, M .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1996, 43 (10) :1732-1741
[20]  
Weitzel CE, 1996, INST PHYS CONF SER, V142, P765