Epitaxial growth of CoSi2 on hydrogen-terminated Si(001)

被引:10
作者
Ishida, K
Miura, Y
Hirose, K
Harada, S
Narusawa, T
机构
[1] Teikyo Univ Sci & Technol, Uenohara, Yamanashi 4090193, Japan
[2] NEC Corp Ltd, Silicon Syst Res Labs, Kanagawa 2291198, Japan
[3] Inst Space & Astronaut Sci, Kanagawa 2298510, Japan
[4] Kochi Univ Technol, Kochi 7828502, Japan
关键词
D O I
10.1063/1.1562335
中图分类号
O59 [应用物理学];
学科分类号
摘要
We demonstrate that CoSi2 grows epitaxially on H-terminated Si(001) and present the growth mechanism. It was found that direct reaction of Co with Si is suppressed on H-terminated Si below 400 degreesC. Thus, the hydrogen at the Co/Si interface hinders the formation of Co2Si and CoSi. Upon thermal desorption of hydrogen at around 400-550 degreesC, CoSi2, which is closely lattice-matched to Si(001), grows on Si(001) and thus, thin epitaxial CoSi2 films are formed on Si(001). The {111}-faceting was completely suppressed in the epitaxial CoSi2/Si(001), leading to the atomically flat interface. (C) 2003 American Institute of Physics.
引用
收藏
页码:1842 / 1844
页数:3
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