Spectroscopic ellipsometry of graphene and an exciton-shifted van Hove peak in absorption

被引：492

作者：

Kravets, V. G. ^{[1
]}

Grigorenko, A. N. ^{[1
]}

Nair, R. R. ^{[1
]}

Blake, P. ^{[1
]}

Anissimova, S. ^{[1
]}

Novoselov, K. S. ^{[1
]}

Geim, A. K. ^{[1
]}

机构：

[1] Univ Manchester, Sch Phys & Astron, Manchester M13 9PL, Lancs, England

来源：

PHYSICAL REVIEW B | 2010年 / 81卷 / 15期

关键词：

D O I：

10.1103/PhysRevB.81.155413

中图分类号：

T [工业技术];

学科分类号：

120111 [工业工程];

摘要：

We demonstrate that optical transparency of any two-dimensional system with a symmetric electronic spectrum is governed by the fine structure constant and suggest a simple formula that relates a quasiparticle spectrum to an optical absorption of such a system. These results are applied to graphene deposited on a surface of oxidized silicon for which we measure ellipsometric spectra, extract optical constants of a graphene layer and reconstruct the electronic dispersion relation near the K point using optical transmission spectra. We also present spectroscopic ellipsometry analysis of graphene placed on amorphous quartz substrates and report a pronounced peak in ultraviolet absorption at 4.6 eV because of a van Hove singularity in graphene's density of states. The peak is asymmetric and downshifted by 0.5 eV probably due to excitonic effects.

引用

页数：6

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