共 16 条
- [3] USEFUL PROPERTIES OF DARK-FIELD ELECTRON IMAGES [J]. PHYSICA STATUS SOLIDI, 1965, 12 (02): : 843 - &
- [4] DIFFRACTION CONTRAST ANALYSIS OF 2-DIMENSIONAL DEFECTS PRESENT IN SILICON AFTER ANNEALING [J]. PHILOSOPHICAL MAGAZINE, 1966, 13 (121): : 71 - &
- [5] BOOKER GR, 1964, DISCUSSIONS FARADAY, P5118
- [7] ELECTRON MICROSCOPIC IMAGES OF SINGLE AND INTERSECTING STACKING FAULTS IN THICK FOILS .1. SINGLE FAULTS [J]. PHYSICA STATUS SOLIDI, 1963, 3 (09): : 1563 - 1593
- [10] LEVINE E, 1967, J APPL PHYS, V38, P81, DOI 10.1063/1.1709015