ERD MEASUREMENT OF THE MEAN RANGES AND VARIANCES OF 0.75-2.0 KEV DEUTERIUM IONS IN BE, C AND SI

被引：9

作者：

ROSS, GG

TERREAULT, B

机构：

[1] INRS-Energie, Université du Québec, Varennes, Que. J3X 1S2

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1990年 / 45卷 / 1-4期

关键词：

D O I：

10.1016/0168-583X(90)90814-B

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The ion beam analysis technique of elastic recoil detection, with E × B filter, has been used to measure the mean ranges and variances of 0.75-2.0 keV D ions in Be, C and Si. Two corresponding Monte Carlo computations (BABOUM and TRIM) have also been performed. Power-law fits as a function of energy, RP = AEn have been adjusted to the experimental and theoretical results. Values of the electronic energy loss parameter (K in dE dx = KE0.5) have been deduced. Possible sources of the significant differences between these and other measurements and computations are discussed. © 1990.

引用

页码：190 / 193

页数：4

共 15 条

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