ORIGIN OF THE PEAKED STRUCTURE IN THE CONDUCTANCE OF ONE-DIMENSIONAL SILICON ACCUMULATION LAYERS

被引:65
作者
WEBB, RA
HARTSTEIN, A
WAINER, JJ
FOWLER, AB
机构
关键词
D O I
10.1103/PhysRevLett.54.1577
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
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页码:1577 / 1580
页数:4
相关论文
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