FOCUSED ION-BEAM REPAIR OF LITHOGRAPHIC MASKS

被引:17
作者
WAGNER, A
LEVIN, JP
机构
关键词
D O I
10.1016/0168-583X(89)90174-2
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
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页码:224 / 230
页数:7
相关论文
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