INTERPRETATION OF CAPACITANCE VERSUS VOLTAGE MEASUREMENTS IN THE PRESENCE OF A HIGH-DENSITY OF DEEP LEVELS

被引：21

作者：

SHIAU, JJ

FAHRENBRUCH, AL

BUBE, RH

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1986年 / 59卷 / 08期

关键词：

D O I：

10.1063/1.336946

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：2879 / 2884

页数：6

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