SURFACE-MORPHOLOGY AND ELECTRONIC-PROPERTIES OF ERSI2

被引：30

作者：

WU, CS ^{[1
]}

LAU, SS ^{[1
]}

KUECH, TF ^{[1
]}

LIU, BX ^{[1
]}

机构：

[1] CALTECH,PASADENA,CA 91125

来源：

THIN SOLID FILMS | 1983年 / 104卷 / 1-2期

关键词：

D O I：

10.1016/0040-6090(83)90559-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：175 / 182

页数：8

共 7 条

[1] THE FORMATION OF SILICIDES FROM THIN-FILMS OF SOME RARE-EARTH-METALS [J].

BAGLIN, JE ;

HEURLE, FMD ;

PETERSSON, CS .

APPLIED PHYSICS LETTERS, 1980, 36 (07) :594-596

[2] DIFFUSION MARKER EXPERIMENTS WITH RARE-EARTH SILICIDES AND GERMANIDES - RELATIVE MOBILITIES OF THE 2 ATOM SPECIES [J].

BAGLIN, JEE ;

DHEURLE, FM ;

PETERSSON, CS .

JOURNAL OF APPLIED PHYSICS, 1981, 52 (04) :2841-2846

[3] SURFACE-MORPHOLOGY OF ERBIUM SILICIDE [J].

LAU, SS ;

PAI, CS ;

WU, CS ;

KUECH, TF ;

LIU, BX .

APPLIED PHYSICS LETTERS, 1982, 41 (01) :77-80

[4] THE SCHOTTKY-BARRIER HEIGHT OF THE CONTACTS BETWEEN SOME RARE-EARTH-METALS (AND SILICIDES) AND P-TYPE SILICON [J].

NORDE, H ;

DESOUSAPIRES, J ;

DHEURLE, F ;

PESAVENTO, F ;

PETERSSON, S ;

TOVE, PA .

APPLIED PHYSICS LETTERS, 1981, 38 (11) :865-867

[5] CONTACT REACTION BETWEEN SI AND RARE-EARTH-METALS [J].

THOMPSON, RD ;

TSAUR, BY ;

TU, KN .

APPLIED PHYSICS LETTERS, 1981, 38 (07) :535-537

[6] ION-BEAM-INDUCED MODIFICATION OF SILICIDE FORMATION IN RARE-EARTH-METALS - ER-SI AND TB-SI SYSTEMS [J].

TSAUR, BY ;

HUNG, LS .

APPLIED PHYSICS LETTERS, 1980, 37 (10) :922-924

[7] LOW SCHOTTKY-BARRIER OF RARE-EARTH SILICIDE ON N-SI [J].

TU, KN ;

THOMPSON, RD ;

TSAUR, BY .

APPLIED PHYSICS LETTERS, 1981, 38 (08) :626-628

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