THE EFFECT OF POINT-DEFECTS ON THE STM IMAGE OF GRAPHITE

被引：17

作者：

SOTO, MR ^{[1
]}

机构：

[1] PENN STATE UNIV,DEPT CHEM,UNIVERSITY PK,PA 16802

来源：

SURFACE SCIENCE | 1990年 / 225卷 / 1-2期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1016/0039-6028(90)90437-D

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Theoretical studies have been done on graphite with substitutional point defects using the extended Huckel band method. Calculations show that there is an unexpected altitude dependence of the charge density directly over the defect which is characteristic of the defect's chemical nature. Furthermore, a point defect acts as a perturbation to distinguish two sublattices which exist in pristine graphite and it creates a charge enhancement in the atoms directly surrounding it. © 1990.

引用

页码：190 / 194

页数：5

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