MICROSCOPIC EVIDENCE OF PLASTIC DEFORMATION ON CLEAVED GERMANIUM SURFACES

被引:11
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NOBLE, WP
HENISCH, HK
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10.1063/1.1709931
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O59 [应用物理学];
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页码:2472 / &
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[1]  
AVERBACH BL, 1959, FRACTURE ED, P90
[2]  
AVERBACH BL, 1959, FRACTURE ED, P68
[3]   METHOD OF PREPARING SI AND GE SPECIMENS FOR EXAMINATION BY TRANSMISSION ELECTRON MICROSCOPY [J].
BOOKER, GR ;
STICKLER, R .
BRITISH JOURNAL OF APPLIED PHYSICS, 1962, 13 (09) :446-&
[4]   DECORATION OF SEMICONDUCTOR SURFACES FOR ELECTRON MICROSCOPY BY DISPLACEMENT DEPOSITION OF GOLD [J].
COUTTS, MD ;
REVESZ, AG .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (08) :3280-&
[5]   TRANSMISSION ELECTRON MICROSCOPY OF CLEAVED SILICON [J].
FRANKL, DR .
JOURNAL OF APPLIED PHYSICS, 1963, 34 (12) :3514-&
[6]   PLASTIC DEFORMATION OF GERMANIUM AND SILICON [J].
GALLAGHER, CJ .
PHYSICAL REVIEW, 1952, 88 (04) :721-722
[7]  
GIBSON AF, 1962, PROGRESS SEMICOND ED, P35
[8]  
GIBSON AF, 1962, PROGRESS SEMICOND ED, P1
[9]   CLEAVAGE CRACKS AND DISLOCATIONS IN LIF-CRYSTALS [J].
GILMAN, JJ ;
KNUDSEN, C ;
WALSH, WP .
JOURNAL OF APPLIED PHYSICS, 1958, 29 (04) :601-607
[10]  
GILMAN JJ, 1957, T AM I MIN MET ENG, V209, P449