共 32 条
[3]
STOICHIOMETRY AND THICKNESS OF THE INITIAL OXIDE FORMED ON CLEAN TITANIUM SURFACES DETERMINED BY QUANTITATIVE AUGER-ELECTRON SPECTROSCOPY, ELECTRON-ENERGY LOSS SPECTROSCOPY, AND MICROGRAVIMETRY
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1983, 1 (04)
:1831-1836
[4]
CHEMICAL AND STRUCTURAL ASPECTS OF REACTION AT THE TI SI INTERFACE
[J].
PHYSICAL REVIEW B,
1984, 30 (10)
:5421-5429
[5]
CHEMICAL BONDING AND REACTIONS AT TI/SI AND TI/OXYGEN/SI INTERFACES
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS,
1983, 1 (02)
:771-775
[6]
CHEMICAL-REACTION AND SCHOTTKY-BARRIER FORMATION AT V/SI INTERFACES
[J].
PHYSICAL REVIEW B,
1984, 29 (04)
:1540-1550
[9]
SI-METAL INTERFACE REACTION AND BULK ELECTRONIC-STRUCTURE OF SILICIDES
[J].
PHYSICA B & C,
1983, 117 (MAR)
:846-847