PULSED-LASER IRRADIATED SILICON STUDIED BY TIME-RESOLVED X-RAY ABSORPTION (90-300 EV)

被引:46
作者
MURAKAMI, K [1 ]
GERRITSEN, HC [1 ]
VANBRUG, H [1 ]
BIJKERK, F [1 ]
SARIS, FW [1 ]
VANDERWIEL, MJ [1 ]
机构
[1] FOM,INST ATOM & MOLEC PHYS,1098 SJ AMSTERDAM,NETHERLANDS
关键词
D O I
10.1103/PhysRevLett.56.655
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
引用
收藏
页码:655 / 658
页数:4
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