CHARACTERIZATION OF RADIATION-DAMAGE MICROSTRUCTURES BY TEM

被引：150

作者：

JENKINS, ML

机构：

[1] Department of Materials, The University of Oxford, Oxford, OX1 3PH, Parks Rd

来源：

JOURNAL OF NUCLEAR MATERIALS | 1994年 / 216卷

关键词：

D O I：

10.1016/0022-3115(94)90010-8

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A critical review is given of the conventional imaging techniques used in transmission electron microscopy to characterise radiation damage microstructures. Particular emphasis is given to the limitations of some of these techniques. The techniques are illustrated by examples.

引用

页码：124 / 156

页数：33

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