共 25 条
[1]
Abeles F, 1950, ANN PHYSIQUE, V5, P596
[2]
EXTREME UV AND X-RAY-SCATTERING MEASUREMENTS FROM A ROUGH LIF CRYSTAL-SURFACE CHARACTERIZED BY ELECTRON MICROGRAPHY
[J].
APPLIED OPTICS,
1989, 28 (10)
:1763-1772
[3]
COMBINED MICROSTRUCTURE X-RAY OPTICS
[J].
REVIEW OF SCIENTIFIC INSTRUMENTS,
1989, 60 (07)
:1588-1595
[4]
BARBEE TW, 1988, P SPIE, V911
[6]
BERROUANE H, 1989, P SPIE, V1160
[7]
BERROUANE H, 1991, UNPUB NUCL INSTR FEB
[8]
BERROUANE H, 1990, P SPIE, V1343
[9]
Botten I. C., 1981, OPT ACTA, V28, P1103
[10]
BOTTEN IC, 1981, OPT ACTA, V285, P413