SCHOTTKY-BARRIER HEIGHT AND ELECTRONIC-STRUCTURE OF THE SI INTERFACE WITH METAL SILICIDES - COSI2, NISI2, AND YSI2

被引:23
作者
FUJITANI, H [1 ]
ASANO, S [1 ]
机构
[1] UNIV TOKYO, COLL ARTS & SCI, INST PHYS, MEGURO KU, TOKYO 153, JAPAN
来源
PHYSICAL REVIEW B | 1994年 / 50卷 / 12期
关键词
D O I
10.1103/PhysRevB.50.8681
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Using the linear muffin-tin orbitals in the atomic-sphere approximation with the local-density approximation (LDA), we studied the electronic structure and Schottky-barrier height (SBH) of the Si interface with metal silicides: CoSi2, NiSi2, and YSi2. We used large supercells with 9 Si-2 and 8-10 silicide (CoSi2, YSi2) layers for the (111) interface and with 11 Si-2 and 11 silicide (NiSi2, CoSi2) layers for the (001) interface. Together with our previous calculations on the two types of NiSi2/Si(111) interfaces, we demonstrate that the LDA calculation with a large supercell correctly reproduces the dependence of experimental SBH's on the interface structure and type of metal silicide. Electron transfer at the silicide-Si interface depends significantly on the atomic structure of the interface, especially the interfacial space, whether atoms are crowded or not. The energy distribution of interfacial gap states varies significantly with interface atomic structures. These electronic structures directly depend on the interface atomic structure; in contrast, the calculated SBH's do not always depend on the interface structure. We discuss the underlying mechanisms for the formation of Schottky barriers.
引用
收藏
页码:8681 / 8698
页数:18
相关论文
共 71 条
[1]   INTERFACIAL SUPERSTRUCTURE OF AIN/N-GAAS(001) SYSTEM FABRICATED BY METALORGANIC CHEMICAL VAPOR-DEPOSITION [J].
AKIMOTO, K ;
HIROSAWA, I ;
MIZUKI, J ;
FUJIEDA, S ;
MATSUMOTO, Y ;
MATSUI, J .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1988, 27 (08) :L1401-L1403
[2]  
Andersen O. K., 1986, ELECT BAND STRUCTURE
[3]   LINEAR METHODS IN BAND THEORY [J].
ANDERSEN, OK .
PHYSICAL REVIEW B, 1975, 12 (08) :3060-3083
[4]  
ANDERSEN OK, 1985, HIGHLIGHTS CONDENSED, P59
[5]  
BADEEN J, 1947, PHYS REV, V71, P717
[6]   SURFACE CRYSTALLOGRAPHY OF YSI2-X FILMS EPITAXIALLY GROWN ON SI(111) - AN X-RAY PHOTOELECTRON DIFFRACTION STUDY [J].
BAPTIST, R ;
FERRER, S ;
GRENET, G ;
POON, HC .
PHYSICAL REVIEW LETTERS, 1990, 64 (03) :311-314
[7]   ORIENTATION-DEPENDENT CHEMISTRY AND SCHOTTKY-BARRIER FORMATION AT METAL-GAAS INTERFACES [J].
CHANG, S ;
BRILLSON, LJ ;
KIME, YJ ;
RIOUX, DS ;
KIRCHNER, PD ;
PETTIT, GD ;
WOODALL, JM .
PHYSICAL REVIEW LETTERS, 1990, 64 (21) :2551-2554
[8]   1ST-PRINCIPLES CALCULATIONS OF MANY-BODY BAND-GAP NARROWING AT AN AL/GAAS(110) INTERFACE [J].
CHARLESWORTH, JPA ;
GODBY, RW ;
NEEDS, RJ .
PHYSICAL REVIEW LETTERS, 1993, 70 (11) :1685-1688
[9]   ATOMIC-STRUCTURE OF THE NISI2/(111)SI INTERFACE [J].
CHERNS, D ;
ANSTIS, GR ;
HUTCHISON, JL ;
SPENCE, JCH .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1982, 46 (05) :849-862
[10]   THE ATOMIC-STRUCTURE OF THE NISI2-(001)SI INTERFACE [J].
CHERNS, D ;
HETHERINGTON, CJD ;
HUMPHREYS, CJ .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1984, 49 (01) :165-177