HIGH-SPEED ELLIPSOMETRY OF ARSENIC-IMPLANTED SI DURING CW LASER ANNEALING

被引:9
作者
MORITANI, A [1 ]
HAMAGUCHI, C [1 ]
机构
[1] OSAKA UNIV,DEPT ELECTR ENGN,SUITA,OSAKA 565,JAPAN
关键词
D O I
10.1063/1.95495
中图分类号
O59 [应用物理学];
学科分类号
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页码:746 / 748
页数:3
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