ANALYSIS OF PASSIVE FILMS ON AUSTENO-FERRITIC STAINLESS-STEEL BY MICROSCOPIC ELLIPSOMETRY

被引：37

作者：

SUGIMOTO, K

MATSUDA, S

机构：

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1983年 / 130卷 / 12期

关键词：

D O I：

10.1149/1.2119579

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

页码：2323 / 2329

页数：7

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[10] ELLIPSOMETRIC MEASUREMENT OF OPTICAL-CONSTANTS AND THICKNESS OF PASSIVE FILMS FORMED ON 18-8 STAINLESS-STEEL [J].

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