ELLIPSOMETRIC MEASUREMENT OF OPTICAL-CONSTANTS AND THICKNESS OF PASSIVE FILMS FORMED ON 18-8 STAINLESS-STEEL

被引：19

作者：

MATSUDA, S ^{[1
]}

SUGIMOTO, K ^{[1
]}

SAWADA, Y ^{[1
]}

机构：

[1] TOHOKU UNIV,FAC ENGN,DEPT MET,SENDAI,MIYAGI 980,JAPAN

来源：

TRANSACTIONS OF THE JAPAN INSTITUTE OF METALS | 1977年 / 18卷 / 01期

关键词：

D O I：

10.2320/matertrans1960.18.66

中图分类号：

TF [冶金工业];

学科分类号：

0806 ;

摘要：

引用

收藏

页码：66 / 74

页数：9

相关论文

共 28 条

[1] Andreeva V.V., 1964, CORROSION, V20, P35
[2] MEASUREMENT AND CORRECTION OF FIRST-ORDER ERRORS IN ELLIPSOMETRY
ASPNES, DE
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (08) : 1077 - &
[3] UNIFIED ANALYSIS OF ELLIPSOMETRY ERRORS DUE TO IMPERFECT COMPONENTS, CELL-WINDOW BIREFRINGENCE, AND INCORRECT AZIMUTH ANGLES
AZZAM, RMA
BASHARA, NM
[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (05) : 600 - &
[4] BOCKRIS JO, 1971, ELECTROCHIM ACTA, V16, P447
[5] POSSIBLE INFLUENCE OF SURFACE ROUGHENING ON ELLIPSOMETRIC DATA IN ELECTROCHEMICAL STUDIES
BRUSIC, V
BOCKRIS, JO
GENSHAW, MA
[J]. SURFACE SCIENCE, 1972, 29 (02) : 653 - &
[6] ELLIPSOMETRIC STUDY OF PASSIVE FILM GROWTH ON STAINLESS-STEEL
BULMAN, GM
TSEUNG, ACC
[J]. CORROSION SCIENCE, 1973, 13 (07) : 531 - 544
[7] DRUDE P, 1890, WIED ANN, V39, P481
[8] ERRORS ARISING FROM SURFACE ROUGHNESS IN ELLIPSOMETRIC MEASUREMENT OF REFRACTIVE INDEX OF A SURFACE
FENSTERMAKER, CA
MCCRACKIN, FL
[J]. SURFACE SCIENCE, 1969, 16 : 85 - +
[9] ELLIPSOMETRIC STUDY OF CHROMIUM PASSIVATION
GENSHAW, MA
SIROHI, RS
[J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1971, 118 (10) : 1558 - &
[10] GROWTH KINETICS OF PASSIVE FILMS ON FE, FE-NI, FE-CR, FE-CRNI ALLOYS
GOSWAMI, KN
STAEHLE, RW
[J]. ELECTROCHIMICA ACTA, 1971, 16 (11) : 1895 - &