共 26 条
[1]
Bender CM, 1978, ADV MATH METHODS SCI, P484
[2]
MEASUREMENT OF RMS ROUGHNESS, AUTOCOVARIANCE FUNCTION AND OTHER STATISTICAL PROPERTIES OF OPTICAL SURFACES USING A FECO SCANNING INTERFEROMETER
[J].
APPLIED OPTICS,
1976, 15 (11)
:2705-2721
[3]
A MONTE-CARLO MICROTOPOGRAPHY MODEL FOR INVESTIGATING PLASMA REACTIVE ION ETCH PROFILE EVOLUTION
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
1988, 6 (02)
:542-550
[5]
Feynman R.OP., 1964, FEYNMAN LECTURES PHY, VII, P6
[7]
KERN DP, 1980, IBM RC8503 RES REP
[10]
LANGER JS, 1984, PHASE TRANSFORMATION, P129