OPTICAL AND ELECTRICAL-PROPERTIES OF THIN SILVER FILMS GROWN UNDER ION-BOMBARDMENT

被引:65
作者
PARMIGIANI, F [1 ]
KAY, E [1 ]
HUANG, TC [1 ]
PERRIN, J [1 ]
JURICH, M [1 ]
SWALEN, JD [1 ]
机构
[1] IBM CORP, ALMADEN RES CTR, SAN JOSE, CA 95120 USA
关键词
D O I
10.1103/PhysRevB.33.879
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:879 / 888
页数:10
相关论文
共 59 条
[1]   OPTICAL-PROPERTIES OF AU - SAMPLE EFFECTS [J].
ASPNES, DE ;
KINSBRON, E ;
BACON, DD .
PHYSICAL REVIEW B, 1980, 21 (08) :3290-3299
[2]  
BARRETT CS, 1966, STRUCTURE METALS, P466
[3]   ELECTRON-ELECTRON SCATTERING IN INTRABAND OPTICAL CONDUCTIVITY OF CU, AG, AND AU [J].
BEACH, RT ;
CHRISTY, RW .
PHYSICAL REVIEW B, 1977, 16 (12) :5277-5284
[4]  
Born M, 1980, PRINCIPLES OPTICS
[5]  
Bottiger J., 1971, Radiation Effects, V11, P69, DOI 10.1080/00337577108230451
[7]   MEASUREMENT AND CALCULATION OF POLARIZATION AND POTENTIAL-ENERGY EFFECTS ON CORE-ELECTRON BINDING-ENERGIES IN SOLIDS - X-RAY PHOTOEMISSION OF RARE-GASES IMPLANTED IN NOBLE-METALS [J].
CITRIN, PH ;
HAMANN, DR .
PHYSICAL REVIEW B, 1974, 10 (12) :4948-4963
[8]  
COUTTS TI, 1974, ELECTRICAL CONDUCTIO
[9]   MODIFICATION OF NIOBIUM FILM STRESS BY LOW-ENERGY ION-BOMBARDMENT DURING DEPOSITION [J].
CUOMO, JJ ;
HARPER, JME ;
GUARNIERI, CR ;
YEE, DS ;
ATTANASIO, LJ ;
ANGILELLO, J ;
WU, CT ;
HAMMOND, RH .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (03) :349-354
[10]  
CUOMO JJ, 1977, J VAC SCI TECHNOL, V14, P152, DOI 10.1116/1.569109