OPTICAL AND ELECTRICAL-PROPERTIES OF THIN SILVER FILMS GROWN UNDER ION-BOMBARDMENT

被引：65

作者：

PARMIGIANI, F ^{[1
]}

KAY, E ^{[1
]}

HUANG, TC ^{[1
]}

PERRIN, J ^{[1
]}

JURICH, M ^{[1
]}

SWALEN, JD ^{[1
]}

机构：

[1] IBM CORP, ALMADEN RES CTR, SAN JOSE, CA 95120 USA

来源：

PHYSICAL REVIEW B | 1986年 / 33卷 / 02期

关键词：

D O I：

10.1103/PhysRevB.33.879

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：879 / 888

页数：10

共 59 条

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