CHARACTERIZATION OF MOBILITY-LIFETIME PRODUCTS AND INTERFACE PROPERTY IN AMORPHOUS-SILICON P-I-N JUNCTIONS

被引:9
作者
OKAMOTO, H
KIDA, H
FUKUMOTO, K
NONOMURA, S
HAMAKAWA, Y
机构
关键词
D O I
10.1016/0022-3093(83)90359-9
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
引用
收藏
页码:1103 / 1106
页数:4
相关论文
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