ION-IMPLANTATION FOR HIGH-SPEED III-V ICS

被引:16
作者
NISHI, H
机构
关键词
D O I
10.1016/0168-583X(85)90587-7
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
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页码:395 / 401
页数:7
相关论文
共 26 条
[1]   APPLICATION OF THERMAL PULSE ANNEALING TO ION-IMPLANTED GAALAS/GAAS HETEROJUNCTION BIPOLAR-TRANSISTORS [J].
ASBECK, PM ;
MILLER, DL ;
BABCOCK, EJ ;
KIRKPATRICK, CG .
IEEE ELECTRON DEVICE LETTERS, 1983, 4 (04) :81-84
[2]  
ASBECK PM, 1983, 1983 EL MAT C VERM
[3]  
CIRILLO NC, 1984, 42ND ANN DEV RES C
[4]  
ELLIOT KR, 1984, APPL PHYS LETT, V40, P898
[5]  
HICKINGBOTTOM R, 1973, RAD EFFECTS, V17, P31
[6]  
KAKIMOTO K, 1984, 9TH P INT C RAM SPEC
[7]  
KASAHARA J, 1982, P SEMIINSULATING 3 5, P238
[8]  
MATSUMOTO K, 1984, 42ND P ANN DEV RES C
[9]   DIRECT OBSERVATION OF DISLOCATION EFFECTS ON THRESHOLD VOLTAGE OF A GAAS FIELD-EFFECT TRANSISTOR [J].
MIYAZAWA, S ;
ISHII, Y ;
ISHIDA, S ;
NANISHI, Y .
APPLIED PHYSICS LETTERS, 1983, 43 (09) :853-855
[10]   A GAAS 16X16 BIT PARALLEL MULTIPLIER [J].
NAKAYAMA, Y ;
SUYAMA, K ;
SHIMIZU, H ;
YOKOYAMA, N ;
OHNISHI, H ;
SHIBATOMI, A ;
ISHIKAWA, H .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1983, 18 (05) :599-603