CHARACTERIZATION OF COATINGS

[11] AES STUDIES OF SURFACE COMPOSITION OF AG-CU ALLOYS [J]. SURFACE SCIENCE, 1975, 47 (01) : 57 - 63

[12] ELUCIDATION OF SURFACE-STRUCTURE AND BONDING BY PHOTOELECTRON-SPECTROSCOPY [J]. SURFACE SCIENCE, 1975, 48 (01) : 99 - 136

[13] BUHL R, 1975, VAKUUM-TECH, V24, P189

[14] Castaing R., 1962, J MICROSCOPIE, V1, P395

[15] ELEMENTAL COMPOSITION PROFILING IN THIN-FILMS BY GLOW-DISCHARGE MASS-SPECTROMETRY - DEPTH RESOLUTION [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (07) : 2828 - 2830

[16] COBURN JW, 1974, J APPL PHYS, V45, P1179

[17] Czanderna A.W., 1975, METHODS SURFACE ANAL

[18] CZANDERNA AW, 1975, METHODS SURFACE ANAL, P139

[19] DIAGNOSTICS OF AN RF SPUTTERING GLOW DISCHARGE, CORRELATION BETWEEN ATOMIC-ABSORPTION AND MASS-SPECTROMETRY [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1975, 17 (02): : 129 - 138

[20] LONG JOURNEY INTO TUNNELING [J]. SCIENCE, 1974, 183 (4130) : 1149 - 1155

[11] AES STUDIES OF SURFACE COMPOSITION OF AG-CU ALLOYS [J]. SURFACE SCIENCE, 1975, 47 (01) : 57 - 63

[12] ELUCIDATION OF SURFACE-STRUCTURE AND BONDING BY PHOTOELECTRON-SPECTROSCOPY [J]. SURFACE SCIENCE, 1975, 48 (01) : 99 - 136

[13] BUHL R, 1975, VAKUUM-TECH, V24, P189

[14] Castaing R., 1962, J MICROSCOPIE, V1, P395

[15] ELEMENTAL COMPOSITION PROFILING IN THIN-FILMS BY GLOW-DISCHARGE MASS-SPECTROMETRY - DEPTH RESOLUTION [J]. JOURNAL OF APPLIED PHYSICS, 1975, 46 (07) : 2828 - 2830

[16] COBURN JW, 1974, J APPL PHYS, V45, P1179

[17] Czanderna A.W., 1975, METHODS SURFACE ANAL

[18] CZANDERNA AW, 1975, METHODS SURFACE ANAL, P139

[19] DIAGNOSTICS OF AN RF SPUTTERING GLOW DISCHARGE, CORRELATION BETWEEN ATOMIC-ABSORPTION AND MASS-SPECTROMETRY [J]. INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1975, 17 (02): : 129 - 138

[20] LONG JOURNEY INTO TUNNELING [J]. SCIENCE, 1974, 183 (4130) : 1149 - 1155