CHARACTERIZATION OF COATINGS

[41] ALLOY SPUTTERING STUDIES WITH IN-SITU AUGER ELECTRON SPECTROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (06) : 2449 - &

[42] DETERMINATION OF SURFACE CONTAMINATION ON SILICON BY LARGE ANGLE ION SCATTERING [J]. APPLIED PHYSICS LETTERS, 1969, 14 (03) : 102 - +

[43] Werner H. W., 1973, Radiation Effects, V18, P269, DOI 10.1080/00337577308232134

[44] THEORETICAL AND EXPERIMENTAL ASPECTS OF SECONDARY ION MASS-SPECTROMETRY [J]. VACUUM, 1974, 24 (10) : 493 - 504

[45] USE OF SECONDARY ION MASS-SPECTROMETRY IN SURFACE ANALYSIS [J]. SURFACE SCIENCE, 1975, 47 (01) : 301 - 323

[41] ALLOY SPUTTERING STUDIES WITH IN-SITU AUGER ELECTRON SPECTROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (06) : 2449 - &

[42] DETERMINATION OF SURFACE CONTAMINATION ON SILICON BY LARGE ANGLE ION SCATTERING [J]. APPLIED PHYSICS LETTERS, 1969, 14 (03) : 102 - +

[43] Werner H. W., 1973, Radiation Effects, V18, P269, DOI 10.1080/00337577308232134

[44] THEORETICAL AND EXPERIMENTAL ASPECTS OF SECONDARY ION MASS-SPECTROMETRY [J]. VACUUM, 1974, 24 (10) : 493 - 504

[45] USE OF SECONDARY ION MASS-SPECTROMETRY IN SURFACE ANALYSIS [J]. SURFACE SCIENCE, 1975, 47 (01) : 301 - 323