DARK-LINE DEFECTS INDUCED BY MECHANICAL BENDING IN GAAS-GA1-XALXAS DOUBLE-HETEROSTRUCTURE WAFERS

被引：35

作者：

KISHINO, S ^{[1
]}

CHINONE, N ^{[1
]}

NAKASHIMA, H ^{[1
]}

ITO, R ^{[1
]}

机构：

[1] HITACHI LTD,CENT RES LABS,KOKUBUNJI 185,TOKYO,JAPAN

来源：

APPLIED PHYSICS LETTERS | 1976年 / 29卷 / 08期

关键词：

D O I：

10.1063/1.89132

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：488 / 490

页数：3

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