COMBINED AES, LEED, SEM AND TEM CHARACTERIZATIONS OF CU-SI(100) INTERFACES

被引:29
作者
HANBUCKEN, M
METOIS, JJ
MATHIEZ, P
SALVAN, F
机构
[1] UNIV AIX MARSEILLE 1,UER PHYS,F-13331 MARSEILLE 3,FRANCE
[2] FAC SCI LUMINY,DEPT PHYS,CNRS,UA 783,CASE 901,F-13288 MARSEILLE 9,FRANCE
关键词
D O I
10.1016/0039-6028(85)90957-4
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:622 / 627
页数:6
相关论文
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