共 19 条
- [2] TRANSMISSION-X-RAY DIFFRACTION GRATING ALIGNMENT USING A PHOTOELASTIC MODULATOR [J]. APPLIED OPTICS, 1988, 27 (16): : 3522 - 3525
- [3] METROLOGY OF ELECTRON-BEAM LITHOGRAPHY SYSTEMS USING HOLOGRAPHICALLY PRODUCED REFERENCE SAMPLES [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (06): : 3606 - 3611
- [4] Bassous E., 1989, Microelectronic Engineering, V9, P167, DOI 10.1016/0167-9317(89)90039-7
- [5] REDUCTION IMAGING AT 14 NM USING MULTILAYER-COATED OPTICS - PRINTING OF FEATURES SMALLER THAN 0.1-MU-M [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1990, 8 (06): : 1509 - 1513
- [6] FABRICATION OF 50 NM LINE-AND-SPACE X-RAY MASKS IN THICK AU USING A 50 KEV ELECTRON-BEAM SYSTEM [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1992, 10 (01): : 118 - 121
- [8] CHU W, IN PRESS MICROELECTR
- [9] GULLIKSON E, 1989, COMMUNICATION
- [10] Henke B. L., 1982, Atomic Data and Nuclear Data Tables, V27, P1, DOI 10.1016/0092-640X(82)90002-X