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RADIATION RESPONSE OF FLOATING GATE EEPROM MEMORY CELLS
被引:111
作者
:
SNYDER, ES
论文数:
0
引用数:
0
h-index:
0
机构:
SEEQ TECHNOL INC,SAN JOSE,CA 95131
SEEQ TECHNOL INC,SAN JOSE,CA 95131
SNYDER, ES
[
1
]
MCWHORTER, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
SEEQ TECHNOL INC,SAN JOSE,CA 95131
SEEQ TECHNOL INC,SAN JOSE,CA 95131
MCWHORTER, PJ
[
1
]
DELLIN, TA
论文数:
0
引用数:
0
h-index:
0
机构:
SEEQ TECHNOL INC,SAN JOSE,CA 95131
SEEQ TECHNOL INC,SAN JOSE,CA 95131
DELLIN, TA
[
1
]
SWEETMAN, JD
论文数:
0
引用数:
0
h-index:
0
机构:
SEEQ TECHNOL INC,SAN JOSE,CA 95131
SEEQ TECHNOL INC,SAN JOSE,CA 95131
SWEETMAN, JD
[
1
]
机构
:
[1]
SEEQ TECHNOL INC,SAN JOSE,CA 95131
来源
:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
|
1989年
/ 36卷
/ 06期
关键词
:
D O I
:
10.1109/23.45415
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:2131 / 2139
页数:9
相关论文
共 24 条
[21]
EFFECT OF POST-OXIDATION ANNEAL TEMPERATURE ON RADIATION-INDUCED CHARGE TRAPPING IN METAL-OXIDE-SEMICONDUCTOR DEVICES
[J].
SCHWANK, JR
论文数:
0
引用数:
0
h-index:
0
SCHWANK, JR
;
FLEETWOOD, DM
论文数:
0
引用数:
0
h-index:
0
FLEETWOOD, DM
.
APPLIED PHYSICS LETTERS,
1988,
53
(09)
:770
-772
[22]
PHYSICAL-MECHANISMS CONTRIBUTING TO DEVICE REBOUND
[J].
SCHWANK, JR
论文数:
0
引用数:
0
h-index:
0
SCHWANK, JR
;
WINOKUR, PS
论文数:
0
引用数:
0
h-index:
0
WINOKUR, PS
;
MCWHORTER, PJ
论文数:
0
引用数:
0
h-index:
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MCWHORTER, PJ
;
SEXTON, FW
论文数:
0
引用数:
0
h-index:
0
SEXTON, FW
;
DRESSENDORFER, PV
论文数:
0
引用数:
0
h-index:
0
DRESSENDORFER, PV
;
TURPIN, DC
论文数:
0
引用数:
0
h-index:
0
TURPIN, DC
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1984,
31
(06)
:1434
-1438
[23]
SCHWANK JR, 1989, COMMUNICATION
[24]
RADIATION RESPONSE OF 64K-BIT AND 128K-BIT ULTRAVIOLET ERASABLE PROGRAMMABLE READ ONLY MEMORIES (UVEPROMS)
[J].
YUE, H
论文数:
0
引用数:
0
h-index:
0
机构:
ROLM CORP, ONE RIVER OAKS PL, SAN JOSE, CA 95134 USA
YUE, H
;
JENNINGS, R
论文数:
0
引用数:
0
h-index:
0
机构:
ROLM CORP, ONE RIVER OAKS PL, SAN JOSE, CA 95134 USA
JENNINGS, R
;
GRAY, R
论文数:
0
引用数:
0
h-index:
0
机构:
ROLM CORP, ONE RIVER OAKS PL, SAN JOSE, CA 95134 USA
GRAY, R
;
VOLMERANGE, H
论文数:
0
引用数:
0
h-index:
0
机构:
ROLM CORP, ONE RIVER OAKS PL, SAN JOSE, CA 95134 USA
VOLMERANGE, H
;
WITTELES, A
论文数:
0
引用数:
0
h-index:
0
机构:
ROLM CORP, ONE RIVER OAKS PL, SAN JOSE, CA 95134 USA
WITTELES, A
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1983,
30
(06)
:4282
-4284
←
1
2
3
→
共 24 条
[21]
EFFECT OF POST-OXIDATION ANNEAL TEMPERATURE ON RADIATION-INDUCED CHARGE TRAPPING IN METAL-OXIDE-SEMICONDUCTOR DEVICES
[J].
SCHWANK, JR
论文数:
0
引用数:
0
h-index:
0
SCHWANK, JR
;
FLEETWOOD, DM
论文数:
0
引用数:
0
h-index:
0
FLEETWOOD, DM
.
APPLIED PHYSICS LETTERS,
1988,
53
(09)
:770
-772
[22]
PHYSICAL-MECHANISMS CONTRIBUTING TO DEVICE REBOUND
[J].
SCHWANK, JR
论文数:
0
引用数:
0
h-index:
0
SCHWANK, JR
;
WINOKUR, PS
论文数:
0
引用数:
0
h-index:
0
WINOKUR, PS
;
MCWHORTER, PJ
论文数:
0
引用数:
0
h-index:
0
MCWHORTER, PJ
;
SEXTON, FW
论文数:
0
引用数:
0
h-index:
0
SEXTON, FW
;
DRESSENDORFER, PV
论文数:
0
引用数:
0
h-index:
0
DRESSENDORFER, PV
;
TURPIN, DC
论文数:
0
引用数:
0
h-index:
0
TURPIN, DC
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1984,
31
(06)
:1434
-1438
[23]
SCHWANK JR, 1989, COMMUNICATION
[24]
RADIATION RESPONSE OF 64K-BIT AND 128K-BIT ULTRAVIOLET ERASABLE PROGRAMMABLE READ ONLY MEMORIES (UVEPROMS)
[J].
YUE, H
论文数:
0
引用数:
0
h-index:
0
机构:
ROLM CORP, ONE RIVER OAKS PL, SAN JOSE, CA 95134 USA
YUE, H
;
JENNINGS, R
论文数:
0
引用数:
0
h-index:
0
机构:
ROLM CORP, ONE RIVER OAKS PL, SAN JOSE, CA 95134 USA
JENNINGS, R
;
GRAY, R
论文数:
0
引用数:
0
h-index:
0
机构:
ROLM CORP, ONE RIVER OAKS PL, SAN JOSE, CA 95134 USA
GRAY, R
;
VOLMERANGE, H
论文数:
0
引用数:
0
h-index:
0
机构:
ROLM CORP, ONE RIVER OAKS PL, SAN JOSE, CA 95134 USA
VOLMERANGE, H
;
WITTELES, A
论文数:
0
引用数:
0
h-index:
0
机构:
ROLM CORP, ONE RIVER OAKS PL, SAN JOSE, CA 95134 USA
WITTELES, A
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1983,
30
(06)
:4282
-4284
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1
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