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RADIATION RESPONSE OF FLOATING GATE EEPROM MEMORY CELLS
被引:111
作者
:
SNYDER, ES
论文数:
0
引用数:
0
h-index:
0
机构:
SEEQ TECHNOL INC,SAN JOSE,CA 95131
SEEQ TECHNOL INC,SAN JOSE,CA 95131
SNYDER, ES
[
1
]
MCWHORTER, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
SEEQ TECHNOL INC,SAN JOSE,CA 95131
SEEQ TECHNOL INC,SAN JOSE,CA 95131
MCWHORTER, PJ
[
1
]
DELLIN, TA
论文数:
0
引用数:
0
h-index:
0
机构:
SEEQ TECHNOL INC,SAN JOSE,CA 95131
SEEQ TECHNOL INC,SAN JOSE,CA 95131
DELLIN, TA
[
1
]
SWEETMAN, JD
论文数:
0
引用数:
0
h-index:
0
机构:
SEEQ TECHNOL INC,SAN JOSE,CA 95131
SEEQ TECHNOL INC,SAN JOSE,CA 95131
SWEETMAN, JD
[
1
]
机构
:
[1]
SEEQ TECHNOL INC,SAN JOSE,CA 95131
来源
:
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
|
1989年
/ 36卷
/ 06期
关键词
:
D O I
:
10.1109/23.45415
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:2131 / 2139
页数:9
相关论文
共 24 条
[11]
MA TP, 1989, IONIZING RAD EFFECTS, P87
[12]
CONSIDERATIONS FOR HARDENING MOS DEVICES AND CIRCUITS FOR LOW RADIATION-DOSES
[J].
MCGARRITY, JM
论文数:
0
引用数:
0
h-index:
0
MCGARRITY, JM
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1980,
27
(06)
:1739
-1744
[13]
SIMPLE TECHNIQUE FOR SEPARATING THE EFFECTS OF INTERFACE TRAPS AND TRAPPED-OXIDE CHARGE IN METAL-OXIDE-SEMICONDUCTOR TRANSISTORS
[J].
MCWHORTER, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
Sandia Natl Lab, Albuquerque, NM,, USA, Sandia Natl Lab, Albuquerque, NM, USA
MCWHORTER, PJ
;
WINOKUR, PS
论文数:
0
引用数:
0
h-index:
0
机构:
Sandia Natl Lab, Albuquerque, NM,, USA, Sandia Natl Lab, Albuquerque, NM, USA
WINOKUR, PS
.
APPLIED PHYSICS LETTERS,
1986,
48
(02)
:133
-135
[14]
RETENTION CHARACTERISTICS OF SNOS NONVOLATILE DEVICES IN A RADIATION ENVIRONMENT
[J].
MCWHORTER, PJ
论文数:
0
引用数:
0
h-index:
0
MCWHORTER, PJ
;
MILLER, SL
论文数:
0
引用数:
0
h-index:
0
MILLER, SL
;
DELLIN, TA
论文数:
0
引用数:
0
h-index:
0
DELLIN, TA
;
AXNESS, CA
论文数:
0
引用数:
0
h-index:
0
AXNESS, CA
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1987,
34
(06)
:1652
-1657
[15]
RADIATION RESPONSE OF SNOS NONVOLATILE TRANSISTORS
[J].
MCWHORTER, PJ
论文数:
0
引用数:
0
h-index:
0
MCWHORTER, PJ
;
MILLER, SL
论文数:
0
引用数:
0
h-index:
0
MILLER, SL
;
DELLIN, TA
论文数:
0
引用数:
0
h-index:
0
DELLIN, TA
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1986,
33
(06)
:1414
-1419
[16]
UV EPROM ERASURE IN FLASH X-RAY AND CO-60 TOTAL DOSE ENVIRONMENTS
[J].
MYERS, DK
论文数:
0
引用数:
0
h-index:
0
MYERS, DK
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1981,
28
(06)
:4038
-4040
[17]
LOT UNIFORMITY AND SMALL SAMPLE SIZES IN HARDNESS ASSURANCE
[J].
NAMENSON, A
论文数:
0
引用数:
0
h-index:
0
机构:
US Naval Research Lab, Washington,, DC, USA
NAMENSON, A
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1988,
35
(06)
:1506
-1511
[18]
VACUUM ULTRAVIOLET RADIATION EFFECTS IN SIO2
[J].
POWELL, RJ
论文数:
0
引用数:
0
h-index:
0
POWELL, RJ
;
DERBENWICK, GF
论文数:
0
引用数:
0
h-index:
0
DERBENWICK, GF
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1971,
NS18
(06)
:99
-+
[19]
NUCLEAR RADIATION RESPONSE OF INTEL 64K-BIT AND 128K-BIT HMOS ULTRAVIOLET ERASABLE PROGRAMMABLE READ ONLY MEMORIES (UVEPROMS)
[J].
RENSNER, GD
论文数:
0
引用数:
0
h-index:
0
机构:
BDM CORP,ALBUQUERQUE,NM 87106
RENSNER, GD
;
ECKHARDT, DA
论文数:
0
引用数:
0
h-index:
0
机构:
BDM CORP,ALBUQUERQUE,NM 87106
ECKHARDT, DA
;
PAGE, M
论文数:
0
引用数:
0
h-index:
0
机构:
BDM CORP,ALBUQUERQUE,NM 87106
PAGE, M
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1985,
32
(06)
:4056
-4060
[20]
TIME AND TOTAL DOSE-RESPONSE OF NON-VOLATILE UVPROMS
[J].
SAMPSON, DF
论文数:
0
引用数:
0
h-index:
0
机构:
Harris Gov Aerosp Syst Div,, Melbourne, FL, USA
SAMPSON, DF
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1988,
35
(06)
:1542
-1546
←
1
2
3
→
共 24 条
[11]
MA TP, 1989, IONIZING RAD EFFECTS, P87
[12]
CONSIDERATIONS FOR HARDENING MOS DEVICES AND CIRCUITS FOR LOW RADIATION-DOSES
[J].
MCGARRITY, JM
论文数:
0
引用数:
0
h-index:
0
MCGARRITY, JM
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1980,
27
(06)
:1739
-1744
[13]
SIMPLE TECHNIQUE FOR SEPARATING THE EFFECTS OF INTERFACE TRAPS AND TRAPPED-OXIDE CHARGE IN METAL-OXIDE-SEMICONDUCTOR TRANSISTORS
[J].
MCWHORTER, PJ
论文数:
0
引用数:
0
h-index:
0
机构:
Sandia Natl Lab, Albuquerque, NM,, USA, Sandia Natl Lab, Albuquerque, NM, USA
MCWHORTER, PJ
;
WINOKUR, PS
论文数:
0
引用数:
0
h-index:
0
机构:
Sandia Natl Lab, Albuquerque, NM,, USA, Sandia Natl Lab, Albuquerque, NM, USA
WINOKUR, PS
.
APPLIED PHYSICS LETTERS,
1986,
48
(02)
:133
-135
[14]
RETENTION CHARACTERISTICS OF SNOS NONVOLATILE DEVICES IN A RADIATION ENVIRONMENT
[J].
MCWHORTER, PJ
论文数:
0
引用数:
0
h-index:
0
MCWHORTER, PJ
;
MILLER, SL
论文数:
0
引用数:
0
h-index:
0
MILLER, SL
;
DELLIN, TA
论文数:
0
引用数:
0
h-index:
0
DELLIN, TA
;
AXNESS, CA
论文数:
0
引用数:
0
h-index:
0
AXNESS, CA
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1987,
34
(06)
:1652
-1657
[15]
RADIATION RESPONSE OF SNOS NONVOLATILE TRANSISTORS
[J].
MCWHORTER, PJ
论文数:
0
引用数:
0
h-index:
0
MCWHORTER, PJ
;
MILLER, SL
论文数:
0
引用数:
0
h-index:
0
MILLER, SL
;
DELLIN, TA
论文数:
0
引用数:
0
h-index:
0
DELLIN, TA
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1986,
33
(06)
:1414
-1419
[16]
UV EPROM ERASURE IN FLASH X-RAY AND CO-60 TOTAL DOSE ENVIRONMENTS
[J].
MYERS, DK
论文数:
0
引用数:
0
h-index:
0
MYERS, DK
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1981,
28
(06)
:4038
-4040
[17]
LOT UNIFORMITY AND SMALL SAMPLE SIZES IN HARDNESS ASSURANCE
[J].
NAMENSON, A
论文数:
0
引用数:
0
h-index:
0
机构:
US Naval Research Lab, Washington,, DC, USA
NAMENSON, A
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1988,
35
(06)
:1506
-1511
[18]
VACUUM ULTRAVIOLET RADIATION EFFECTS IN SIO2
[J].
POWELL, RJ
论文数:
0
引用数:
0
h-index:
0
POWELL, RJ
;
DERBENWICK, GF
论文数:
0
引用数:
0
h-index:
0
DERBENWICK, GF
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1971,
NS18
(06)
:99
-+
[19]
NUCLEAR RADIATION RESPONSE OF INTEL 64K-BIT AND 128K-BIT HMOS ULTRAVIOLET ERASABLE PROGRAMMABLE READ ONLY MEMORIES (UVEPROMS)
[J].
RENSNER, GD
论文数:
0
引用数:
0
h-index:
0
机构:
BDM CORP,ALBUQUERQUE,NM 87106
RENSNER, GD
;
ECKHARDT, DA
论文数:
0
引用数:
0
h-index:
0
机构:
BDM CORP,ALBUQUERQUE,NM 87106
ECKHARDT, DA
;
PAGE, M
论文数:
0
引用数:
0
h-index:
0
机构:
BDM CORP,ALBUQUERQUE,NM 87106
PAGE, M
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1985,
32
(06)
:4056
-4060
[20]
TIME AND TOTAL DOSE-RESPONSE OF NON-VOLATILE UVPROMS
[J].
SAMPSON, DF
论文数:
0
引用数:
0
h-index:
0
机构:
Harris Gov Aerosp Syst Div,, Melbourne, FL, USA
SAMPSON, DF
.
IEEE TRANSACTIONS ON NUCLEAR SCIENCE,
1988,
35
(06)
:1542
-1546
←
1
2
3
→