A RANDOM-ACCESS PHOTODIODE ARRAY FOR INTELLIGENT IMAGE CAPTURE

被引：68

作者：

YADIDPECHT, O

GINOSAR, R

DIAMAND, YS

机构：

[1] Department of Electrical Engineering, Technion—Isreal Institute of Technology, Haifa

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1991年 / 38卷 / 08期

关键词：

D O I：

10.1109/16.119013

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A novel chip implementing random scan was designed, fabricated, and tested. The chip covers the basic requirements for random access and separation between the sampling and reading processes. In this way, a repeated reading of any pixel at any time can take place. The chip includes an 80 x 80 matrix of basic cells. Each cell consists of two stages: The first is based on a switch, whereas the second includes a buffer. The chip was fabricated in a 3-mu-m CMOS process. It was found to operate functionally. However, the use of a standard process gave rise to the crosstalk phenomenon, which has yet to be overcome.

引用

页码：1772 / 1780

页数：9

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