TRANSMISSION ELECTRON MICROSCOPE INVESTIGATIONS ON DIFFUSED SILICON WAFERS WITH RELATION TO ELECTRICAL PROPERTIES OF CONTROLLED RECTIFIERS

被引：6

作者：

KNOPP, AN

STICKLER, R

机构：

来源：

JOURNAL OF THE ELECTROCHEMICAL SOCIETY | 1964年 / 111卷 / 12期

关键词：

D O I：

10.1149/1.2426007

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

引用

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页码：1372 / 1376

页数：5

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