FABRICATION OF DEEP SUB-MU-M NARROW-CHANNEL SI-MOSFETS WITH 2FOLD-GATE STRUCTURES

被引:4
作者
YOSHIMURA, T
IGURA, Y
ICHIGUCHI, T
MATSUOKA, H
TAKEDA, E
OKAZAKI, S
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1989年 / 28卷 / 10期
关键词
D O I
10.1143/JJAP.28.2183
中图分类号
O59 [应用物理学];
学科分类号
摘要
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页码:2183 / 2187
页数:5
相关论文
共 14 条
[1]   TRANSMISSION RESONANCES AND THE LOCALIZATION LENGTH IN ONE-DIMENSIONAL DISORDERED-SYSTEMS [J].
AZBEL, MY ;
SOVEN, P .
PHYSICAL REVIEW B, 1983, 27 (02) :831-835
[2]   SUB-100-NM CHANNEL-LENGTH TRANSISTORS FABRICATED USING X-RAY-LITHOGRAPHY [J].
CHOU, SY ;
SMITH, HI ;
ANTONIADIS, DA .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (01) :253-255
[3]   NOVEL INTERFERENCE EFFECTS BETWEEN PARALLEL QUANTUM WELLS [J].
DATTA, S ;
MELLOCH, MR ;
BANDYOPADHYAY, S ;
NOREN, R ;
VAZIRI, M ;
MILLER, M ;
REIFENBERGER, R .
PHYSICAL REVIEW LETTERS, 1985, 55 (21) :2344-2347
[4]   CONDUCTANCE IN RESTRICTED-DIMENSIONALITY ACCUMULATION LAYERS [J].
FOWLER, AB ;
HARTSTEIN, A ;
WEBB, RA .
PHYSICAL REVIEW LETTERS, 1982, 48 (03) :196-199
[5]   NONMONOTONIC VARIATIONS OF THE CONDUCTANCE WITH ELECTRON-DENSITY IN APPROXIMATELY 70-NM-WIDE INVERSION-LAYERS [J].
KWASNICK, RF ;
KASTNER, MA ;
MELNGAILIS, J ;
LEE, PA .
PHYSICAL REVIEW LETTERS, 1984, 52 (03) :224-227
[6]   ELECTRON-STATES IN NARROW GATE-INDUCED CHANNELS IN SI [J].
LAUX, SE ;
STERN, F .
APPLIED PHYSICS LETTERS, 1986, 49 (02) :91-93
[7]   VARIABLE-RANGE HOPPING IN FINITE ONE-DIMENSIONAL WIRES [J].
LEE, PA .
PHYSICAL REVIEW LETTERS, 1984, 53 (21) :2042-2045
[8]   UNIVERSAL CONDUCTANCE FLUCTUATIONS IN METALS [J].
LEE, PA ;
STONE, AD .
PHYSICAL REVIEW LETTERS, 1985, 55 (15) :1622-1625
[9]   DESIGN AND EXPERIMENTAL TECHNOLOGY FOR 0.1-MU-M GATE-LENGTH LOW-TEMPERATURE OPERATION FETS [J].
SAIHALASZ, GA ;
WORDEMAN, MR ;
KERN, DP ;
GANIN, E ;
RISHTON, S ;
ZICHERMAN, DS ;
SCHMID, H ;
POLCARI, MR ;
NG, HY ;
RESTLE, PJ ;
CHANG, THP ;
DENNARD, RH .
IEEE ELECTRON DEVICE LETTERS, 1987, 8 (10) :463-466
[10]  
Saitou N., 1986, Microelectronic Engineering, V5, P123, DOI 10.1016/0167-9317(86)90038-9