MEASUREMENT OF ANGLE-RESOLVED X-RAY-SCATTERING FROM SYNTHETIC MULTILAYERS

被引：10

作者：

ISHIKAWA, T ^{[1
]}

IIDA, A ^{[1
]}

MATSUSHITA, T ^{[1
]}

机构：

[1] UNIV TOKYO,FAC ENGN,DEPT IND CHEM,BUNKYO KU,TOKYO 113,JAPAN

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1986年 / 246卷 / 1-3期

关键词：

D O I：

10.1016/0168-9002(86)90104-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：348 / 351

页数：4

共 7 条

[1]

Barbee Jr. T.W., 1981, AIP C P, V75, P131

[2] DESIGN OF DOUBLY FOCUSING, TUNABLE (5-30 KEV), WIDE BANDPASS OPTICS MADE FROM LAYERED SYNTHETIC MICROSTRUCTURES [J].

BILDERBACK, DH ;

LAIRSON, BM ;

BARBEE, TW ;

ICE, GE ;

SPARKS, CJ .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 208 (1-3) :251-261

[3] MULTILAYER REFLECTORS FOR THE EXTREME ULTRAVIOLET SPECTRAL REGION [J].

KORTRIGHT, JB .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1986, 246 (1-3) :344-347

[4] X-RAY MIRROR SURFACES EVALUATED BY AN X-RAY TOPOGRAPHICAL TECHNIQUE [J].

MANCINI, DC ;

BILDERBACK, DH .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 208 (1-3) :263-272

[5] HIGH-RESOLUTION MEASUREMENTS OF ANGLE-RESOLVED X-RAY-SCATTERING FROM OPTICALLY FLAT MIRRORS [J].

MATSUSHITA, T ;

ISHIKAWA, T ;

KOHRA, K .

JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1984, 17 (AUG) :257-264

[6] PERFORMANCE OF LAYERED SYNTHETIC MICROSTRUCTURES IN MONOCHROMATOR APPLICATIONS IN THE SOFT-X-RAY REGION [J].

PIANETTA, P ;

BARBEE, TW ;

REDAELLI, R .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1986, 246 (1-3) :352-355

[7]

Spiller E., 1981, AIP C P, V75, P124

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