REACTION-KINETICS IN SYNCHROTRON-RADIATION-EXCITED SI EPITAXY WITH DISILANE .2. PHOTOCHEMICAL-VAPOR DEPOSITION

被引:20
作者
AKAZAWA, H
UTSUMI, Y
机构
[1] NTT LSI Laboratories, Atsugi-shi, Kanagawa 243-01
关键词
D O I
10.1063/1.360071
中图分类号
O59 [应用物理学];
学科分类号
摘要
When a Si substrate in ambient disilane (Si2H6) is irradiated with synchrotron radiation (SR), three distinct species are excited simultaneously: irreversibly chemisorbed surface hydride, disilane gas, and disilane weakly trapped on the surface. The species-specific growth pathways in the SR-excited chemical-vapor deposition (SR-CVD) were investigated to clarify the reaction kinetics. Growth at pressure less than 10(-5) Torr is due predominantly to the regeneration of new chemisorption sites by stimulated hydrogen desorption. With increasing pressure, the role of gas-phase photolysis becomes important. In the nonirradiated region, Eley-Rideal-type reactions of the decomposition products with the surface hydrides deposit Si adlayers in a layer-by-layer fashion. In the irradiated region, however, growth resulting from multilayer photolysis of weakly trapped disilane produces a hydrogenated Si network layer on the surface, and the layer converts to a uniform and epitaxial Si film. (C) 1995 American Institute of Physics.
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页码:2740 / 2750
页数:11
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