APPEARANCE POTENTIAL SPECTROSCOPY - RELATIVE SIGNAL STRENGTHS FROM 3D-TRANSITION METALS

被引：10

作者：

GRANT, JT

HOOKER, MP

HAAS, TW

机构：

[1] UNIV ENERGY SYST INC,3195 PLAINFIELD RD,DAYTON,OH 45432

[2] AEROSP RES LABS,WRIGHT PATTERSON AFB,OH 45433

来源：

SURFACE SCIENCE | 1975年 / 51卷 / 02期

关键词：

D O I：

10.1016/0039-6028(75)90392-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：433 / 440

页数：8

共 9 条

[1] EFFECT OF MODULATION AMPLITUDE ON ELECTRON-EXCITED AUGER DATA FROM TITANIUM [J].

GRANT, JT ;

HAAS, TW ;

HOUSTON, JE .

SURFACE SCIENCE, 1974, 42 (01) :1-11

[2] QUANTITATIVE COMPARISON OF TI AND TIO SURFACES USING AUGER-ELECTRON AND SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPIES [J].

GRANT, JT ;

HAAS, TW ;

HOUSTON, JE .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :227-230

[3] CORRECTIONS OF AUGER-ELECTRON SIGNAL STRENGTHS FOR MODULATION AMPLITUDE DISTORTION IN A 4-GRID RETARDING POTENTIAL-ENERGY ANALYZER [J].

GRANT, JT ;

HAAS, TW .

SURFACE SCIENCE, 1974, 44 (02) :617-623

[4]

HOUSTON JE, 1974, REV SCI INSTRUM, V45, P897, DOI 10.1063/1.1686763

[5] DIFFERENCE IN CR L3/L2 INTENSITY RATIO MEASURED BY SOFT-X-RAY AND AUGER-ELECTRON APPEARANCE-POTENTIAL SPECTROSCOPY [J].

HOUSTON, JE ;

PARK, RL .

PHYSICAL REVIEW B, 1972, 5 (10) :3808-&

[6] EFFECT OF OXYGEN ON SOFT X-RAY APPEARANCE POTENTIAL SPECTRUM OF CHROMIUM [J].

HOUSTON, JE ;

PARK, RL .

JOURNAL OF CHEMICAL PHYSICS, 1971, 55 (09) :4601-&

[7] SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPY [J].

PARK, RL ;

HOUSTON, JE .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :1-18

[8] L-SHELL SOFT-X-RAY APPEARANCE-POTENTIAL SPECTRA OF 3D TRANSITION-METALS [J].

PARK, RL ;

HOUSTON, JE .

PHYSICAL REVIEW B, 1972, 6 (04) :1073-&

[9] ELECTRONIC-STRUCTURE OF SOLID SURFACES - CORE LEVEL EXCITATION TECHNIQUES [J].

PARK, RL ;

HOUSTON, JE .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1973, 10 (01) :176-182

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