THE ANALYSIS OF OPTICAL-SPECTRA BY FOURIER METHODS

被引：47

作者：

ASPNES, DE

机构：

来源：

关键词：

D O I：

10.1016/0039-6028(83)90224-8

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：284 / 306

页数：23

共 22 条

[1] Aspnes D. E., 1976, OPTICAL PROPERTIES S, P799
[2] HIGH-RESOLUTION INTERBAND-ENERGY MEASUREMENTS FROM ELECTROREFLECTANCE SPECTRA
ASPNES, DE
ROWE, JE
[J]. PHYSICAL REVIEW LETTERS, 1971, 27 (04) : 188 - &
[3] THIRD-DERIVATIVE MODULATION SPECTROSCOPY WITH LOW-FIELD ELECTROREFLECTANCE
ASPNES, DE
[J]. SURFACE SCIENCE, 1973, 37 (01) : 418 - 442
[4] DIELECTRIC FUNCTIONS AND OPTICAL-PARAMETERS OF SI, GE, GAP, GAAS, GASB, INP, INAS, AND INSB FROM 1.5 TO 6.0 EV
ASPNES, DE
STUDNA, AA
[J]. PHYSICAL REVIEW B, 1983, 27 (02) : 985 - 1009
[5] BRACEWELL R, 1978, FOURIER TRANSFORM IT
[6] ELECTRONIC-STRUCTURE OF SILICON
CHELIKOWSKY, JR
COHEN, ML
[J]. PHYSICAL REVIEW B, 1974, 10 (12): : 5095 - 5107
[7] ELECTROREFLECTANCE AND ELLIPSOMETRY OF SILICON FROM 3 TO 6 EV
DAUNOIS, A
ASPNES, DE
[J]. PHYSICAL REVIEW B, 1978, 18 (04): : 1824 - 1839
[8] DAVIS PJ, 1965, NBS US APPL MATH SER, V55, pCH6
[9] DUFFIEUX PM, 1983, FOURIER TRANSFORM IT, pCH1
[10] GROBNER W, 1961, INTEGRALTAFEL