REMEASUREMENT OF A SILICON LATTICE PERIOD

被引：30

作者：

DESLATTES, RD

TANAKA, M

GREENE, GL

HENINS, A

KESSLER, EG

机构：

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 1987年 / 36卷 / 02期

关键词：

D O I：

10.1109/TIM.1987.6312661

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：166 / 169

页数：4

共 11 条

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[2] ABSOLUTE MEASUREMENT OF THE (220)-LATTICE PLANE SPACING IN A SILICON CRYSTAL [J].

BECKER, P ;

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[3]

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[4]

DESLATTES R, 1984, NBS SPEC PUBL, V617, P303

[5] ABSOLUTE, PROMPT GAMMA-RAY SPECTROSCOPY AND THE DETERMINATION OF FUNDAMENTAL CONSTANTS [J].

DESLATTES, RD ;

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[6] REMEASUREMENT OF GAMMA-RAY REFERENCE LINES [J].

DESLATTES, RD ;

KESSLER, EG ;

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HENINS, A .

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[7] NEW DETERMINATION OF THE DEUTERON BINDING-ENERGY AND THE NEUTRON MASS [J].

GREENE, GL ;

KESSLER, EG ;

DESLATTES, RD ;

BORNER, H .

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[8] HIGH PRECISION LATTICE PARAMETER MEASUREMENTS BY MULTIPLE BRAGG REFLEXION DIFFRACTOMETRY [J].

HART, M .

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[9] THE AVOGADRO CONSTANT - RECENT RESULTS ON THE MOLAR VOLUME OF SILICON [J].

SEYFRIED, P ;

BALHORN, R ;

KOCHSIEK, M ;

KOZDON, AF ;

RADEMACHER, HJ ;

WAGENBRETH, H ;

PEUTO, AM ;

SACCONI, A .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1987, 36 (02) :161-165

[10] DETERMINATION OF SILICON UNIT-CELL PARAMETERS BY PRECISION-MEASUREMENTS OF BRAGG PLANE SPACINGS [J].

SIEGERT, H ;

BECKER, P ;

SEYFRIED, P .

ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1984, 56 (04) :273-278

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