PROCESS CHARACTERIZATION OF NIOBIUM BASED JOSEPHSON INTEGRATED-CIRCUITS

被引：6

作者：

VILLEGIER, JC

GONICHE, M

LEVIS, M

RENARD, P

VABRE, M

VELER, JC

机构：

来源：

IEEE TRANSACTIONS ON MAGNETICS | 1983年 / 19卷 / 03期

关键词：

D O I：

10.1109/TMAG.1983.1062441

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：942 / 945

页数：4

共 17 条

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[3]

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[4]

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[7] PENETRATION DEPTH MEASUREMENTS ON TYPE-2 SUPERCONDUCTING FILMS [J].

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[8]

IMAMURA T, 1979, FUJITSU SCI TECH J, V15, P21

[9]

JACKEL LD, 1980, SQUID 80, P257

[10]

JILLIC DW, 1982, ASC SF, V8

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