PROCESS CHARACTERIZATION OF NIOBIUM BASED JOSEPHSON INTEGRATED-CIRCUITS

被引:6
作者
VILLEGIER, JC
GONICHE, M
LEVIS, M
RENARD, P
VABRE, M
VELER, JC
机构
关键词
D O I
10.1109/TMAG.1983.1062441
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:942 / 945
页数:4
相关论文
共 17 条
[11]   PROCESS TEST CHIP FOR JOSEPHSON INTEGRATED-CIRCUITS [J].
KLEPNER, SP .
IEEE TRANSACTIONS ON MAGNETICS, 1981, 17 (01) :282-285
[12]   FABRICATION OF NBN-PB JOSEPHSON TUNNEL-JUNCTIONS WITH A NOVEL INTEGRATION METHOD [J].
KOSAKA, S ;
SHINOKI, F ;
TAKADA, S ;
HAYAKAWA, H .
IEEE TRANSACTIONS ON MAGNETICS, 1981, 17 (01) :314-317
[13]   SPECIFIC CAPACITANCE OF JOSEPHSON TUNNEL-JUNCTIONS [J].
MAGERLEIN, JH .
IEEE TRANSACTIONS ON MAGNETICS, 1981, 17 (01) :286-289
[14]   JOSEPHSON EDGE-JUNCTION DEVICES USING E-BEAM LITHOGRAPHY [J].
VETTIGER, P ;
MOORE, DF ;
FORSTER, T .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (11) :1385-1393
[15]   SOME PROPERTIES OF NB-NB2O5-PB(IN) JOSEPHSON TUNNEL-JUNCTIONS FOR DEVICES APPLICATIONS [J].
VILLEGIER, JC ;
MATHERON, G .
IEEE TRANSACTIONS ON MAGNETICS, 1981, 17 (01) :855-857
[16]  
VILLEGIER JC, 1980, SQUID 80, P381
[17]  
VILLEGIER JC, 1982, ASC SE, V3