INSITU MEASUREMENTS OF CRITICAL LAYER THICKNESS AND OPTICAL STUDIES OF INGAAS QUANTUM WELLS GROWN ON GAAS SUBSTRATES

被引:80
作者
ELMAN, B
KOTELES, ES
MELMAN, P
JAGANNATH, C
LEE, J
DUGGER, D
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D O I
10.1063/1.102279
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O59 [应用物理学];
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页码:1659 / 1661
页数:3
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