RHEED OSCILLATION STUDIES OF MBE GROWTH-KINETICS AND LATTICE MISMATCH STRAIN-INDUCED EFFECTS DURING INGAAS GROWTH ON GAAS(100)

被引：131

作者：

LEWIS, BF ^{[1
]}

LEE, TC ^{[1
]}

GRUNTHANER, FJ ^{[1
]}

MADHUKAR, A ^{[1
]}

FERNANDEZ, R ^{[1
]}

MASERJIAN, J ^{[1
]}

机构：

[1] UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90089

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1984年 / 2卷 / 03期

关键词：

D O I：

10.1116/1.582887

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：419 / 424

页数：6

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