RHEED OSCILLATION STUDIES OF MBE GROWTH-KINETICS AND LATTICE MISMATCH STRAIN-INDUCED EFFECTS DURING INGAAS GROWTH ON GAAS(100)

被引:131
作者
LEWIS, BF [1 ]
LEE, TC [1 ]
GRUNTHANER, FJ [1 ]
MADHUKAR, A [1 ]
FERNANDEZ, R [1 ]
MASERJIAN, J [1 ]
机构
[1] UNIV SO CALIF,DEPT MAT SCI,LOS ANGELES,CA 90089
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 1984年 / 2卷 / 03期
关键词
D O I
10.1116/1.582887
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:419 / 424
页数:6
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