PIXE ANALYSIS OF INTERMEDIATE AND THICK TARGETS VIA LINE INTENSITY RATIOS

被引：10

作者：

BAUMAN, S

HOUMERE, PD

NELSON, JW

ELDRED, RA

CAHILL, TA

机构：

[1] UNIV CALIF DAVIS, DEPT PHYS, DAVIS, CA 95616 USA

[2] UNIV CALIF DAVIS, CROCKER NUCL LAB, DAVIS, CA 95616 USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1984年 / 3卷 / 1-3期

关键词：

D O I：

10.1016/0168-583X(84)90363-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：203 / 205

页数：3

共 13 条

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