CHARACTERIZATION OF N-DOPED MGZNSSE COMPOUND SYSTEM GROWN ON INTENTIONALLY MISORIENTED GAAS SUBSTRATES BY MOLECULAR-BEAM EPITAXY

被引:12
作者
ICHIMURA, Y [1 ]
KISHINO, K [1 ]
SATAKE, M [1 ]
KURAMOTO, M [1 ]
YOSHIDA, A [1 ]
机构
[1] SOPHIA UNIV,DEPT ELECT & ELECTR ENGN,CHIYODA KU,TOKYO 102,JAPAN
关键词
D O I
10.1016/0022-0248(95)80052-E
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The optical and electrical characteristics of the nitrogen-doped MgZnSSe compound system grown on intentionally misoriented GaAs substrates by molecular beam epitaxy, were systemically investigated. With increasing substrate misorientation angle (SMA), a blue-shift of the photoluminescence peak was observed for MgZnSSe and ZnSSe, indicating the increased incorporation ratio of S and Mg into crystals, With it, the net acceptor concentration (N-A-N-D) decreased in the range less than 10(17) cm(-3). On the contrary, for ''sulfur-free'' MgZnSe and ZnSe compounds, the (N-A - N-D) value was increased with SMA. This fact suggested that the presence of sulfur and the enhanced incorporation of that caused the degraded p-doping characteristics in MgZnSSe on misoriented substrates.
引用
收藏
页码:812 / 816
页数:5
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