The optical and electrical characteristics of the nitrogen-doped MgZnSSe compound system grown on intentionally misoriented GaAs substrates by molecular beam epitaxy, were systemically investigated. With increasing substrate misorientation angle (SMA), a blue-shift of the photoluminescence peak was observed for MgZnSSe and ZnSSe, indicating the increased incorporation ratio of S and Mg into crystals, With it, the net acceptor concentration (N-A-N-D) decreased in the range less than 10(17) cm(-3). On the contrary, for ''sulfur-free'' MgZnSe and ZnSe compounds, the (N-A - N-D) value was increased with SMA. This fact suggested that the presence of sulfur and the enhanced incorporation of that caused the degraded p-doping characteristics in MgZnSSe on misoriented substrates.