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- [4] CRANK J, 1957, MATH DIFFUSION, P11
- [5] RELATION BETWEEN SURFACE CONCENTRATION AND AVERAGE CONDUCTIVITY IN DIFFUSED LAYERS IN GERMANIUM [J]. BELL SYSTEM TECHNICAL JOURNAL, 1961, 40 (02): : 509 - +
- [7] ACCURACY OF 4-PROBE RESISTIVITY MEASUREMENTS ON SILICON [J]. BRITISH JOURNAL OF APPLIED PHYSICS, 1962, 13 (05): : 231 - &
- [8] RESISTIVITY OF BULK SILICON AND OF DIFFUSED LAYERS IN SILICON [J]. BELL SYSTEM TECHNICAL JOURNAL, 1962, 41 (02): : 387 - +
- [10] AN AC BRIDGE FOR SEMICONDUCTOR RESISTIVITY MEASUREMENTS USING A 4-POINT PROBE [J]. BELL SYSTEM TECHNICAL JOURNAL, 1961, 40 (03): : 885 - +