X-RAY-DIFFRACTION STUDY OF MICROSTRUCTURE IN ZNS THIN-FILMS GROWN FROM ZINC ACETATE BY ATOMIC LAYER EPITAXY

被引：24

作者：

OIKKONEN, M ^{[1
]}

BLOMBERG, M ^{[1
]}

TUOMI, T ^{[1
]}

TAMMENMAA, M ^{[1
]}

机构：

[1] HELSINKI UNIV TECHNOL,DEPT CHEM,SF-02150 ESPOO,FINLAND

来源：

关键词：

D O I：

10.1016/0040-6090(85)90282-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：317 / 321

页数：5

共 11 条

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[7] X-RAY-DIFFRACTION STUDY OF THIN ELECTROLUMINESCENT ZNS FILMS GROWN BY ATOMIC LAYER EPITAXY
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[8] EXPERIMENTAL SEPARATION OF K-ALPHA-1 AND K-ALPHA-2 COMPONENTS IN X-RAY-LINE PROFILE ANALYSIS
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[10] SELECTED ANALYTICAL TOOLS YIELD A BETTER INSIGHT INTO ELECTROLUMINESCENT THIN-FILMS
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