IMPROVEMENT OF REGROWN INTERFACE IN INP ORGANOMETALLIC VAPOR-PHASE EPITAXY

被引:12
作者
MIYAMOTO, Y [1 ]
HIRAYAMA, H [1 ]
SUEMASU, T [1 ]
MIYAKE, Y [1 ]
ARAI, S [1 ]
机构
[1] TOKYO INST TECHNOL,DEPT PHYS ELECTR,MEGURO KU,TOKYO 152,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1991年 / 30卷 / 4B期
关键词
REGROWTH; INP; OMVPE; (NH4)S-2(X); PREHEATING PROCESS;
D O I
10.1143/JJAP.30.L672
中图分类号
O59 [应用物理学];
学科分类号
摘要
It is shown that a preheating process in a pure hydrogen atmosphere with a (NH4)2S(x) treatment was effective for improvement of the regrown interface in InP organometallic vapor phase epitaxy (OMVPE). The carrier concentration was under 5 x 10(15) cm-3 in the entire region after the regrowth, even if we carried out various dummy processes of fabrication between the first growth and the surface treatment for improvement. Thus, this improvement will be useful for the device-required regrowth process after fabrication of an ultrafine-size structure.
引用
收藏
页码:L672 / L674
页数:3
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