CORRELATION OF HOT-CARRIER AND RADIATION EFFECTS IN MOS-TRANSISTORS

被引：25

作者：

MCBRAYER, JD

FLEETWOOD, DM

PASTOREK, RA

JONES, RV

机构：

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1985年 / 32卷 / 06期

关键词：

D O I：

10.1109/TNS.1985.4334046

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：3935 / 3939

页数：5

共 11 条

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